Puig T., Celentano G., Palau A., Obradors X., Mestres N., Ricart S., Sotgiu G., Pop C., Piperno L., Ternero P., Alcalа J.
Ключевые слова: HTS, YBCO, films, chemical solution deposition, heat treatment, precursors, substrate LaAlO3, spin coating process, fabrication, microstructure, X-ray diffraction, magnetization, critical temperature, critical current density, critical caracteristics, Jc/B curves, temperature dependence, experimental results
Valladares L.D., Barnes C.H., Cornejo H.S., Dominguez A.B., Osorio.Anaya A.M., Santibanez J.F., Sovero L.S.
Hanisch J., Falter M., Backer M., Rikel M., Driessche I., Meledin A., Rijckaert H., Bennewitz J., Diez-Sierra J., Sadewasser M., Koliotassis L., Lopez-Dominguez P.
Ключевые слова: HTS, YBCO, coated conductors, chemical solution deposition, reel-to-reel process, nanocomposites, substrate Ni-W, fabrication, doping effect, nanoscaled effects, nanoparticles, critical current, distribution, uniformity, angular dependence, critical caracteristics, Jc/B curves, pinning force, temperature dependence, magnetic field dependence, X-ray diffraction, microstructure, commercialization
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Pinto V., Domenici F., Orlanducci S., Angelis M.D., Carcione R., Palmieri D., Politi S., Tomellini M.
Ключевые слова: HTS, YBCO, thin films, substrate LaAlO3, chemical solution deposition, fabrication, multilayered structures, magnetron sputtering, protection layer Ag, protection layer Au, interfaces, critical caracteristics, critical current density, heat treatment, microstructure, Raman spectroscopy, experimental results
Holzapfel B., Hanisch J., Nast R., Driessche I.V., Erbe M., Cayado P., Rijckaert H., Buysser K.D., Sierra J.D., Dominguez P.L.
Ключевые слова: chemical solution deposition, inkjet printing, HTS, YBCO, nanocomposites, substrate LaAlO3, thin films, nanodoping, critical caracteristics, critical current density, thickness dependence, X-ray diffraction, microstructure, angular dependence, Jc/B curves, magnetic field dependence, pinning force, fabrication, experimental results
Puig T., Obradors X., Ricart S., Guzman R., Soler L., Farjas J., Mocuta C., Chamorro N., Jareсo J., Banchewski J., Rasi S., Yanez R., Roura-Grabulosa P.
Galluzzi V., Mancini A., Puig T., Celentano G., Palau A., Obradors X., Bartolome E., Augieri A., Pompeo N., Silva E., Torokhtii K., Alimenti A.
Ключевые слова: HTS, YBCO, films epitaxial, PLD process, chemical solution deposition, substrate LaAlO3, nanoscaled effects, anisotropy, impedance, angular dependence, magnetic field dependence, measurement technique, defects, nanorods, twin boundaries, nanoparticles, pinning mechanism, flux flow resistance, comparison
Puig T., Obradors X., Gazquez J., Guzman R., Mundet B., Valvidares S.M., Pellegrin E., Bartolomeм E., Herrero-Martнn J.
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Hanisch J., Muller R., Huhtinen H., Paturi P., Driessche I.V., Backer M., Rikel M., Rijckaert H., Bennewitz J., Buysser K.D., Dнez-Sierra J., Lуpez-Dominguez P., Khan M.Z.*, Falte M., Schafer S., Schunk S.A.
Ключевые слова: HTS, YBCO, nanocomposites, nanoscaled effects, thin films, substrate LaAlO3, chemical solution deposition, X-ray diffraction, microstructure, lattice parameter, critical current density, transport currents, magnetic field dependence, critical caracteristics, angular dependence, experimental results
Puig T., Obradors X., Ricart S., Guzman R., Soler L., Farjas J., Mocuta C., Banchewski J., Rasi S., Roura-Grabulosa P., Jareno J., Kreuzer M.
Ключевые слова: HTS, REBCO, coated conductors, joints, bridges, precursors, solder, fabrication, chemical solution deposition, microstructure, resistive transition, critical current density
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